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SRPS EN 60749-18:2008

Status: Објављен
Lang: English
Pages: 32
Published: 09.10.2008
National registry: 104/8
Number of decision:
Edition: 1 ED
Related international standards
This standard is identical to:
EN 60749-18:2003   CLC/SR 47
Price: 2956 RSD

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Serbian title

Poluprovodničke komponente - Metode mehaničkih i klimatskih ispitivanja - Deo 18: Jonizujuće zračenje (ukupna doza)

English title

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

Serbian scope

Ovaj standard obezbeđuje postupke ispitivanja za definisanje zahteva za ispitivanje kućišta poluprovodničkih integrisanih kola i diskretnih poluprovodničkih komponenti pri uticaju jonizujućeg zračenja (totalna doza) 60 grama kobalta.

English scope

Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.

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